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Surface Analysis of Polymers by XPS and Static SIMS

Name: Surface Analysis of Polymers by XPS and Static SIMS
Brand: Cambridge University Press
SKU: 02017882
Price: 72.02 EUR
Availability: InStock
Author: D. Briggs
ISBN: 9780521017534

D. Briggs

Língua

Inglês

Livro Capa mole

Código Libristo: 02017882

Editoras Cambridge University Press, dezembro 2005

This book provides an in-depth treatment of the instrumentation, physical bases and applications of... Descrição completa

Código Libristo: 02017882

174 b

72.02 €

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This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.