Contacto
Como comprar
Entrega
Guia de compras
Scanning Electron Microscopy
Inglês
278 b
Política de devolução de 30 dias
Os clientes também compraram
/
Capa mole
32.83
€
/
Capa mole
15.65
€
Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.
Sobre o livro
Inglês
Ofereça este livro hoje
É fácil
1 Adicione ao carrinho e escolha Entregar como presente ao finalizar a compra 2 Receberá um vale 3 O livro chegará ao endereço do destinatárioTambém pode estar interessado em
/
Livro de capa dura
87.40
€
/
Livro de capa dura
26.97
€
/
Livro de capa dura
117.51
€
/
Capa mole
5.75
€
/
Capa mole
16.36
€
