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Atomic Force Microscopy: A Concise Introduction

Name: Atomic Force Microscopy: A Concise Introduction
Brand: World Scientific Publishing Company
SKU: 49878957
Price: 92.32 EUR
Availability: InStock
Author: BURNHAM NANCY A
ISBN: 9789819823093

BURNHAM NANCY A

Língua

Inglês

Livro Livro de capa dura

Código Libristo: 49878957

Editoras World Scientific Publishing Company, dezembro 2025

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fu... Descrição completa

Código Libristo: 49878957

225 b

92.32 €

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This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.

Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

Part I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.
Part II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.
Advanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.